1- Properties of x-rays, electromagnetic radiation,
continuous spectrum, characteristic radiation, absorption, filters, production
of X-rays, detection and safety.
2-Crystal structure, planes & directions, atomic
sizes and coordination & stereographic projections.
3-Diffraction, Bragg’s law, diffraction methods and
diffraction under non-ideal conditions.
4-Scattering by an electron, atom and unit cell,
structure factor, multibicity factor, Lorentz factor, absorption factor, temperature
factor, and intensitive of powder diffraction patterns.
5-Debye Scherrer method, Laue method, diffractometer, proportional
counter, Geiger counter and Scintillation counter.
6-Determination of crystal structure, indexing of powder
pattern, and effect of cell distortion.
7-Determination of precise lattice parameter and method
of least squares.
8-Phase diagram determination, parametric &
disappearing phase method.
9-Order-disorder transformation, super-lattice lines and
their detection.
10-Qualitative & quanitative chemical analysis;
Hanawalt method; parameter method, direct comparison and limitation.
11-Stress measurement and it’s application, texture and
it’s application.
12-Electron & neutron diffraction and its
applications.
