Abstract
Abstract. Scanning probe microscopes (SPM) such as atomic and magnetic force microscopes, have become important devices for the investigation of surfaces in different media. They have proved to be able to produce very high resolution images of the sample under investigation. In its basic form, it involves scanning a very fine tip close to the surface and monitoring the deflection of a cantilever on which the tip is mounted. A detailed model which characterises the dynamic behaviour of the scanning probe microscope cantilever such as its natural frequency and modal shapes is presented In scanning probe instruments, the cantilevers are extremely susceptible to external disturbances such as acoustic noise and building vibrations, which ultimately limits their performance. This thesis aims to implement active vibration control to minimise the effects of these disturbances and so increase the instr